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ARTICLE
theoretically some dimers of benzene not yet known and, as
we will show, molecules that should be kinetically persistent.
Here, in Figure 17, we show just the set of dimers that emerge
from this investigation, all local minima on the C
12
H
12
surface.
Of these molecules, 1,
66
2
,
67
3
,
68
11
,
69
and 12
70
are known, as
well as derivatives of 4.
71
These molecules lie (calculated) 36 (3)
À112 (9) kcal/mol
above two benzene molecules. We will give a full account
elsewhere
65
of the calculated barriers to the reversion of these
dimers to two benzenes, as well as other potential escape routes
from their high-energy situation. For the moment, it su
ffices to
say that, for some of the unknown isomers, activation barriers are
likely to be high, and these structures have a very good chance of
kinetic persistence, even at room temperature. One approach to
simulating irregular polymerization of benzene would be to take
this set of dimers and proceed with adding a third and a fourth
molecule of benzene. That remains to be done.
’ CONCLUSION
In this study benzene has been compressed in a sequence of
calculations up to 300 GPa. The computational results show that
the phase I f phase II transition occurs at ∼4 GPa, phase II f
phase III at
∼7 GPa, and phase IIIf phase V at ∼40 GPa. The
agreement with the order of phase transitions found in experimental
studies, especially below 10 GPa, is good. Above 50 GPa, hints that
molecular structures are unstable with respect to saturated, four-
coordinate at C phases
—one-, two-, and three-dimensional—led
us to examine such phases in detail.
We have found that several graphane phases are more stable
than any of the molecular phases over the entire range of pressures
studied, including P = 1 atm. A qualitative argument for that order of
stability is given.
But the molecular phases encounter large
—sometimes very
large
—barriers to rearrangement to a saturated polymer or
network of the graphane type. In particular, phonon dispersion
calculations show that phase III is dynamically stable up to
∼200
GPa and might become metallic before transformation to a
saturated phase. Several simple models for the metallization of
benzene are investigated. We also speculate on the possible
existence of a phase-coherent Kekul
e metal. Finally, in a first
approach to nucleated benzene polymerization, we calculate
the structures of a number of benzene dimers, some known,
some not.
’ ASSOCIATED CONTENT
b
S
Supporting Information.
Details of computed ben-
zene phase structural parameters; simulated X-ray di
ffraction
patterns of benzene phases;
“parallel” phase I and II, “C
6
F
6
”
Figure 17.
Structures of some benzene dimers.
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Journal of the American Chemical Society
ARTICLE
phase, and
“C
6
H
6
ÀC
6
F
6
” phases; distance histogram and den-
sity of states of polymer I; dynamical analysis for phase III;
distance histogram of phase III at various pressures; C
ÀC, CÀH,
intermolecular H---H, and intramolecular H---H distances in
phase III; band structure of phase III at 190 GPa; density of states
of polymer II at 210, 250, and 300 GPa; computed total density of
states for phase III at 190 and 200 GPa, comparing DFT and eH
methods; analysis of the lattice stability of phase III at 190 and
200 GPa; e
ffect of rotation on metallization of phase III at 150
GPa; calculated dielectric functions for phase III; phonon
dispersion of graphanes; computed total density of states for
graphanes; band structure of 1D and 2D benzene models; and
three kinds of rotations in 2D benzene models. This material is
available free of charge via the Internet at http://pubs.acs.org.
’ AUTHOR INFORMATION
Corresponding Author
rh34@cornell.edu
Present Addresses
†
Theoretical Division, Los Alamos National Laboratory, Los
Alamos, NM 87545
’ ACKNOWLEDGMENT
The four reviews we obtained of this paper were extraordina-
rily detailed and useful
—we really appreciate the reviewers’
comments. We are grateful to Dr. P. Raiteri for suggesting some
benzene phases. Our work at Cornell was supported by the
National Science Foundation through Grants CHE-0613306,
CHE-0910623, and DMR-0907425, and by EFree, an Energy
Frontier Research Center funded by the U.S. Department of
Energy, O
ffice of Science, Office of Basic Energy Sciences, under
Award Number DESC0001057. This research was also sup-
ported by the National Science Foundation through TeraGrid
resources provided by NCSA. Some calculations were performed
in part at the Cornell NanoScale Facility, a member of the
National Nanotechnology Infrastructure Network, which is
supported by the National Science Foundation.
’ REFERENCES
(1) Mujica, A.; Rubio, A.; Mu
~noz, A.; Needs, R. J. Rev. Mod. Phys.
2003
, 75, 863
–912.
(2) Weir, S. T.; Mitchell, A. C.; Nellis, W. J. Phys. Rev. Lett. 1996,
76, 1860
–1863.
(3) Narayana, C.; Luo, H.; Orlo
ff, J.; Euoff, A. L. Nature 1998,
393, 46
–49.
(4) Bridgman, P. W. Phys. Rev. 1914, 3, 153
–203.
(5) Thi
ery, M. M.; Leger, J. M. J. Chem. Phys. 1988, 89, 4255–4271.
(6) Ciabini, L.; Gorelli, F. A.; Santoro, M.; Bini, R.; Schettino, V.;
Mezouar, M. Phys. Rev. B 2005, 72, 094108.
(7) Ciabini, L.; Santoro, M.; Gorelli, F. A.; Bini, R.; Schettino, V.;
Raugei, S. Nature Mater. 2007, 6, 39
–43.
(8) Piermarini, G. J.; Mighell, A. D.; Weir, C. E.; Block, S. Science
1969
, 165, 1250
–1256.
(9) Katrusiak, A.; Podsiad
zo, M.; Budzianowski, A. Cryst. Growth Des.
2010
, 10, 3461
–3465.
(10) Raiteri, P.; Martonak, R.; Parrinello, M. Angew. Chem. Int. Ed.
2005
, 44, 3769
–3773.
(11) Carlsson, A. E.; Ashcroft, N. W. Phys. Rev. Lett. 1983, 50, 1305.
(12) Ashcroft, N. W. Phys. Rev. Lett. 2004,
92, 187002.
(13) Zurek, E.; Ho
ffmann, R.; Ascroft, N. W.; Oganov, A.; Lyakhov,
A. Proc. Natl. Acad. Sci. U.S.A. 2009, 106, 17640
–17643.
(14) Yakusheva, B.; Yakushev, V. V.; Dremin, A. N. High Temp. High
Pressure 1971, 3, 261
–266.
(15) See the papers cited in ref 7, for example.
(16) Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1997,
78, 1396
–1396.
(17) Kresse, G.; Hafner, J. Phys. Rev. B 1993, 47, 558
–561.
(18) Bloechl, P. E. Phys. Rev. B 1994, 50, 17953
–17979.
(19) Kresse, G.; Joubert, D. Phys. Rev. B 1999, 59, 1758
–1775.
(20) Glass, C. W.; Oganov, A. R.; Hansen, N. Comput. Phys.
Commun. 2006, 175, 713
–720.
(21) Oganov, A. R.; Glass, C. W. J. Chem. Phys. 2006, 124, 244704.
(22) Oganov, A. R.; Glass, C. W; Ono, S. Earth Planet. Sci. Lett. 2006,
241, 95
–103.
(23) Lonie, D.; Zurek, E. Comput. Phys. Commun. 2011, 182, 372
–387.
(24) Herzfeld, K. F.; Goeppert Mayer, M. Phys. Rev. B 1934, 46,
995
–1001.
(25) Wodrich, M. D.; Corminboeuf, C.; Schleyer, P. v. R. Org. Lett.
2006
, 8, 3631
–3634.
(26) Grimme, S. J. Comput. Chem. 2006, 27, 1787
–1799.
(27) Bu
cko, T.; Hafner, J.; Lebegue, S.; Angyan, J. G. J. Phys. Chem. A
2010
, 114, 11814
–11824.
(28) Johnson, K. A.; Ashcroft, N. W. Nature 2000, 403, 632
–635.
(29) Huller, M.; Prager, M.; Press, W.; Seydel, T. J. Chem. Phys. 2008,
128, 034503.
(30) Johnson, R. D.; Yannoni, C. S.; Dorn, H. C.; Salem, J. R.;
Bethune, D. S. Science 1992, 255, 1235
–1238.
(31) Nicol, M.; Yin, G. Z. J. Phys. (Paris) 1984, 45 (C8), 163
–172.
(32) Drickhamer, H. H. Science 1967, 156, 1183
–1189.
(33) Shaik, S.; Shurki, A.; Danovich, D.; Hiberty, P. Chem. Rev. 2001,
101, 1501
–1539.
(34) From Handbook of Chemistry and Physics, all gases at 298 K.
(35) Douglas, J. E.; Rabinovitch, B. S.; Looney, F. S. J. Chem. Phys.
1955
, 23, 315
–323.
(36) Blanksby, S. J.; Ellison, G. B. Acc. Chem. Res. 2003, 36, 255
–263.
(37) Sluiter, M. H. F.; Kawazoe, Y. Phys. Rev. B 2003, 68, 085410.
(38) Sofo, J. O.; Chaudhari, A.; Barber, G. D. Phys. Rev. B 2007,
75, 153401.
(39) Elias, D. C.; Nair, R. R.; Mohiuddin, T. M. G.; Morozov, S. V.;
Blake, P.; Halsall, M. P.; Ferrari, A. C.; Boukhvalov, D. W.; Katsnelson,
M. I.; Geim, A. K.; Novoselov, K. S. Science 2009, 323, 610
–613.
(40) Ryu, S.; Han, M. Y.; Maultzsch, J.; Heinz, T. F; Kim, P.;
Steigerwald, M. L.; Brus, L. E. Nano Lett. 2009, 8, 4597
–4602.
(41) Wen, X.-D.; Hand, L.; Labet, V.; Yang, T.; Ho
ffmann, R.;
Ashcroft, N. W.; Artem, R. O.; Andriy, O. L. Proc. Natl. Acad. Sci. U.S.A.
2011
, 108, 6833
–6837.
(42) Nuspl, G.; Polborn, K.; Evers, J.; Landrum, G. A.; Ho
ffmann, R.
Inorg. Chem. 1996, 35, 6922
–6932 and references therein.
(43) Landrum, G. A.; Ho
ffmann, R.; Evers, J.; Boysen, H. Inorg.
Chem. 1998, 37, 5754
–5763 and references therein.
(44) Bojin, M. D.; Ho
ffmann, R. Helv. Chim. Acta 2003, 86, 1653–
1682 and references therein.
(45) R
€udorff, W.; R€uddorf, G. Z. Anorg. Allg. Chem. 1947, 253, 281–
296.
(46) Ebert, L. B.; Brauman, J. I.; Huggins, R. A. J. Am. Chem. Soc.
1974
, 96, 7841
–7842.
(47) Charlier, J. C.; Gonze, X.; Michenaud, J. P. Phys. Rev. B 1993,
47, 16162
–16168.
(48) Bhattacharya, A.; Bhattacharya, S.; Majumder, C.; Das, G. P.
Phys. Rev. B 2011, 83, 033404.
(49) Leenaerts, O.; Peelaers, H.; Hern
andez-Nieves, A. D.; Partoens,
B.; Peeters, F. M. Phys. Rev. B 2010, 82, 195436.
(50) Pickard, C. J.; Needs, R. J. Nature Phys. 2007, 3, 473
–476.
(51) Katz, T. J.; Acton, N. J. Am. Chem. Soc. 1973, 95, 2738
–2739.
(52) Katz, T. J.; Wang, E. J. J. Am. Chem. Soc. 1971, 93, 3782
–3783.
(53) Tamelen, E. E. V.; Pappas, S. P. J. Am. Chem. Soc. 1962, 84,
3789
–3791.
(54) Woodward, R. B.; Ho
ffmann, R. J. Am. Chem. Soc. 1965, 87,
395
–397.
9035
dx.doi.org/10.1021/ja201786y |
J. Am. Chem. Soc. 2011, 133, 9023–9035
Journal of the American Chemical Society
ARTICLE
(55) Car, R.; Parrinello, M. Phys. Rev. Lett. 1985, 55, 2471.
(56) Grochala, W.; Ho
ffmann, R.; Feng, J.; Ashcroft, N. W. Angew.
Chem. Int. Ed. 2007, 46, 3620
–3642.
(57) Wang, Z.; Wen, X.-D.; Ho
ffmann, R.; Son, J. S.; Li, R.; Fang,
C.-C.; Smilgies, D.-M.; Hyeon, T. Proc. Natl. Acad. Sci. U.S.A. 2010, 107,
17119
–17124.
(58) (a) Goldhammer, D. A. Theorie und ihre Folgerungen; Teubner:
Leipzig, 1913. (b) Herzfeld, K. F. Phys. Rev. 1927, 29, 701
–705.(c)
Batsanov, S. S. Refractometry and Chemical Structure; Van Nostrand:
New York, 1966.
(59) Anderson, P. W. The Theory of Superconductivity in High-Tc
Cuprates; Princeton University Press: Princeton, NJ, 1997.
(60) Merz, K. M., Jr.; Ho
ffmann, R.; Balaban, A. T. J. Am. Chem. Soc.
1987
, 109, 6742
–6751.
(61) The bulk and shear moduli contain information regarding the
hardness of a material with respect to various types of deformation. In
this work, the Reuss de
finition is utilized to compute the bulk and shear
moduli: bulk modulus = (S
11
þ S
22
þ S
33
þ 2(S
12
þ S
13
þ S
23
))
À1
;
shear modulus = 15/[4(S
11
þ S
22
þ S
33
À S
12
À S
13
À S
23
)
þ 3(S
44
þ
S
55
þ S
66
)], where S
ij
(1/GPa) are the elastic compliance constants.
(62) McSkimin, H. J.; Bond, W. L. Phys. Rev. 1957, 105, 116
–121.
(63) Engelke, R. J. Am. Chem. Soc. 1986, 108, 5799
–5803.
(64) Engelke, R.; Hay, P. J.; Klier, D. A.; Wadt, W. R. J. Am. Chem.
Soc. 1984, 106, 5439
–5446.
(65) Rogachev, A. Y.; Wen, X.-D.; Ho
ffmann, R. Angew Chem. Int.
Ed. 2011, submitted.
(66) (a) R
€ottele, H.; Martin, W.; Oth, J. F. M.; Schr€oder, G. Chem.
Ber. 1969, 102, 3985
–3995. (b) Berson, J. A.; Davis, R. F. J. Am. Chem.
Soc. 1972, 94, 3658
–3659.
(67) Yang, N. C.; Hrnjez, B. J.; Horner, M. G. J. Am. Chem. Soc. 1987,
109, 3158
–3159.
(68) (a) Braun, R.; Kummer, M.; Martin, H. D.; Rubin, M. B. Angew.
Chem. Int. Ed. 1985, 24, 1059
–1060. (b) Bertsch, A.; Grimme, W.;
Reinhardt, G. Angew. Chem. Int. Ed. 1986, 25, 377
–378.
(69) Yang, N. C.; Horner, M. G. Tetrahedron Lett. 1986, 27, 543
–546.
(70) Martin, H. D.; Pf
€ohler, P. Angew. Chem. Int. Ed. 1978, 17, 847–848.
(71) Tim, K.; Srinivasachar, K.; Yang, N. C. J. Chem. Soc., Chem.
Commun. 1979, 1038
–1040.