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Pvi20 Front Cover indd0ccc6cf01d-the-cell-doctor-a-detailed-health-check-for-industrial-silicon-wafer-solar-cellsCurrent loss analysis
The various current losses are quantified
at the maximum power point by applying
relatively simple mathematical formulae
[1]. The losses due to metallization, front-
surface reflectance and front-surface
escape (this is light that ‘escapes’ from the
solar cell device without being absorbed
– see Fig. 3) are calculated from the
measurements and using the photon flux
of the AM1.5G spectrum. The current
losses due to shunt resistance and diode
recombination are calculated from a
one-diode model using the measured
resistance at the maximum power point.
The recombination losses in the solar cell
are determined using the calculated IQE
that is properly corrected for the non-ideal
reflection by the front metal grid.
The resulting current losses for the
investigated Al-BSF solar cell are shown
in Fig. 4. It is clear from this that most of
the current is lost by the non-perfect
IQE of the solar cell, which explains
the PV industry’s interest in solar cell
designs featuring a selective emitter and
a passivated rear. The current loss due to
metal shading is also significant, which is
why all-back-contact solar cells and metal-
wrap-through and emitter-wrap-through
solar cells are attracting a lot of attention.
“
Most of the current is lost
by the non-perfect IQE of the
solar cell.
”
Figure 2. External and internal quantum efficiency and reflectance measurements of a standard industrial p-type Al-BSF silicon
wafer solar cell: (a) full-area, and (b) active-area corrected.
(a)
(b)
400
600
800
1000
1200
0
20
40
60
80
100
EQ
E,
IQ
E,
R (
%
)
Wavelength (nm)
EQE
IQE
R
400
600
800
1000
1200
0
20
40
60
80
100
EQ
E
aa
, IQ
E
aa
, R
aa
(%
)
Wavelength (nm)
EQE
aa
IQE
aa
R
aa
Metal shading
100% loss
Acve area
Acve area
Front-surface
escape
Front-surface
reectance
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